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Attach the thin film to the suction cup, and the height difference between the coated surface and the uncoated surface measured is the thickness of the coating.
The THINKFOCUS spectral confocal profiler and the laser confocal microscope can achieve identical measurement results when measuring features on the order of 100 nanometers or larger. However, the microscope suffers from the disadvantage of a small field of view. In contrast, the spectral confocal displacement sensor boasts a measurement range of up to 100 × 100 mm. Below is a comparison of measurement results obtained using a laser confocal microscope and a spectral confocal 3D profiler.
Scan the 3D morphology of microfabricated components and extract the profile to measure the surface roughness of the bottom groove.
Scan the three-dimensional surface of lithium-ion battery electrodes and extract a profile to measure their surface roughness.
When measuring thick-film resistors, the spectral confocal displacement sensor can perform measurements even when the resistor is in a wet state. Both ceramic and silver paste can be measured stably at the same time.
Scan and measure the surface topography of leather products.
Scan the three-dimensional surface of the metal sheet and measure the depth of the blind holes on its surface.
Scan the three-dimensional surface topography of the metal part after wear, and use software algorithms to fit the measured wear volume on the surface.
Scan the three-dimensional topography of specific areas of the LCD and extract profiles to obtain step differences at various locations.
Scan and measure the 3D morphology of sprayed ink, and extract the profile to measure ink thickness.
The double-head scanning electrode coats the surface and measures the coating thickness; the software monitors the production process to optimize the manufacturing procedure.
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