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LCD morphology scanning measurement
Scan the three-dimensional topography of specific areas of the LCD and extract profiles to obtain step differences at various locations.
Category:
Description
Measurement requirements
Scan the three-dimensional topography of specific areas of the LCD and extract profiles to obtain step differences at various locations.
Overview of Key Features
1. Non-contact measurement, integrated design
2. 3D morphology scanning, multi-functional data processing
3. Precise measurement applicable to various materials
4. Simple to use and easy to assemble and disassemble.
5. Fast scanning speed and high positioning accuracy
6. Repeatability accuracy guaranteed from ±0.5 to ±1 μm
7. High stability and strong anti-interference capability
Address the issues currently existing in measurement devices.
1. There are certain requirements for the measurement materials.
2. Contact measurement causes damage to the measured material.
3. Small measurement range, uncertain positioning, and difficult determination.
4. Slow measurement speed, low accuracy, and large measurement errors.
5. Complex structure, high cost
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Channel
Douyin Account
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