Sapphire Thickness Measurement
Measurement requirements
Scan the sapphire surface with thickness mode to measure the thickness of different parts
Key Features Overview
1. Non-contact measurement, integrated design
2. Three-dimensional topography scanning, multi-function data processing
3. Suitable for accurate measurement of various materials
4. Easy to use, easy to assemble and disassemble
5. Fast scanning speed and high positioning accuracy
6.±0.5 to ±1μm repeatability guarantee
7. High stability and strong anti-interference ability
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Measurement results
The thickness of sapphire is about 0.1mm.
Solve the problems of the current measuring device
1. There are certain requirements for measuring materials
2. Contact measurement, damage to the measurement material
3. The measurement range is small, the position is uncertain, and the measurement is difficult
4. The measurement speed is slow, the precision is low, and the measurement error is large
5. Complex structure and high cost
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Customer service contact information
Service hours:9:00 — 18:00
24 hours after sale
Contact number:
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Hotline:021-37781691
E-Mail:contact@think-focus.com
Address: Room 204, Building D2, Innovation Workshop, No. 6000, Shenzhuan Road, Songjiang District, Shanghai