Measurement requirements
Measuring the surface roughness of special material films

Overview of key features
1. Non-contact measurement, integrated design
2. Three-dimensional topography scanning, multi-function data processing
3. Suitable for accurate measurement of various materials
4. Easy to use, easy to assemble and disassemble
5. Fast scanning speed and high positioning accuracy
6. ±0.5 to ±1μm repeatability guarantee

7. High stability and strong anti-interference ability

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Measurement results
The film roughness Ra is about 0.8μm

Solve the problems of the current measuring device

1. There are certain requirements for measurement materials
2. Contact measurement, damage to the measurement material
3. The measurement range is small, the position is uncertain, and the measurement is difficult
4. The measurement speed is slow, the precision is low, and the measurement error is large

5. Complex structure and high cost