Measurement requirements
Scan the three-dimensional topography of the surface of electronic components, extract the profile and measure the level difference of the desired position on the surface

Overview of key features
1. Non-contact measurement, integrated design

2. Three-dimensional topography scanning, multi-function data processing
3. Suitable for accurate measurement of various materials

4. Simple to use, easy to assemble and disassemble

5. Fast scanning speed and high positioning accuracy

6.±0.5 to ±1μm repeat accuracy guarantee

7. High stability and strong anti-interference ability

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Measurement results
The measured position level difference is about 320μm.

Solve the problems of the current measuring device

1. There are certain requirements for measurement materials
2. Contact measurement, damage to the measurement material
3. The measurement range is small, the position is uncertain, and the measurement is difficult
4. The measurement speed is slow, the precision is low, and the measurement error is large

5. Complex structure and high cost