Measurement requirements
Scanning the surface of an electronic component in three dimensions and extracting a profile to measure the segment differences at the desired location on the surface.

Main features：

1. Non-contact measurement, all-in-one design

2. 3D topography scanning, multifunctional data processing

3. Suitable for precise measurement of various materials.

4. Simple to use, easy to install and disassemble

5. Fast scanning speed, high positioning accuracy

6.±0.5 to ±1μm repeatability guarantee

7. High stability, strong anti-interference ability

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Measurement results
The measured position level difference is about 320μm.

Solve the problems of the current measuring device

1. There are certain requirements for measurement materials
2. Contact measurement, damage to the measurement material
3. The measurement range is small, the position is uncertain, and the measurement is difficult
4. The measurement speed is slow, the precision is low, and the measurement error is large

5. Complex structure and high cost