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Topography measurement of electronic components

Topography measurement of electronic components

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Topography measurement of electronic components

Scanning the three-dimensional topography of the surface of electronic components, extracting the profile to measuring the level difference and roughness of several positions on the surface
Product serial number
Product description
Parameters

Measurement requirements
Scanning the three-dimensional topography of the surface of electronic components, extracting the profile to measuring the level difference and roughness of several positions on the surface.

 

Overview of key features
1. Non-contact measurement, integrated design

2. Three-dimensional topography scanning, multi-function data processing
3. Suitable for accurate measurement of various materials

4. Simple to use, easy to assemble and disassemble

5. Fast scanning speed and high positioning accuracy

6.±0.5 to ±1μm repeated accuracy guarantee

7. High stability and strong anti-interference ability

 

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Measurement results
The measured value of each part is basically close to the standard value

 

Solve the problems of the current measuring device

1. There are certain requirements for measurement materials
2. Contact measurement, damage to the measurement material
3. The measurement range is small, the position is uncertain, and the measurement is difficult
4. The measurement speed is slow, the precision is low, and the measurement error is large

5. Complex structure and high cost

We could not find any corresponding parameters, please add them to the properties table
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