Measurement requirements
Measure the three-dimensional topography of the edge of the mobile phone case and detect the scratched position of the mobile phone case

Overview of key features
1. Non-contact measurement, integrated design

2. Three-dimensional topography scanning, multi-function data processing
3. Suitable for accurate measurement of various materials

4. Simple to use, easy to assemble and disassemble

5. Fast scanning speed and high positioning accuracy

6.±0.5 to ±1μm repeat accuracy guarantee

7. High stability and strong anti-interference ability

Measurement results
The scratch depth is about 27μm

Solve the problems of the current measuring device

There are certain requirements for measuring materials
Contact measurement, damage to the measurement material
The measurement range is small, the location is uncertain, and the measurement is difficult
The measurement speed is slow, the accuracy is low, and the measurement error is large

Complex structure and high cost