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Apple logo topography measurement

Apple logo topography measurement

Number of views:
1000

Apple logo topography measurement

Category:
Cell phone
Scan the three-dimensional shape of the Apple logo on the phone case, extract the profile and measure the level difference at different positions
Product serial number
Product description
Parameters

Measurement requirements
Scan the three-dimensional appearance of the Apple logo on the phone case, extract the profile and measure the step difference at different positions

 

Overview of key features

1. Non-contact measurement, integrated design

2. Three-dimensional topography scanning, multi-function data processing

3. Accurate measurement for various materials

4. Simple to use, easy to assemble and disassemble

5. Fast scanning speed and high positioning accuracy

6.±0.5 to ±1μm repeat accuracy guarantee

7. High stability and strong anti-interference ability

 

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Measurement results
The difference between different positions is different, basically between 0 and 15μm

 

Solve the problems of the current measuring device

1. Small amount of wear, difficult to measure

2. There are certain requirements for material contact measurement, which is harmful to the measurement material

3. The bad wear position is uncertain, the measurement speed is slow, the accuracy is low, and the measurement error is large

 

4. Complex structure and high cost

We could not find any corresponding parameters, please add them to the properties table
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