The interferometric thickness gauge of the visualization module is added, and the position of the light spot can be observed microscopically for measuring tiny devices.
Z-axis dynamic measurement range 5-10mm (no strict requirements for distance, fluctuations in this range can be measured)
Large working distance, large dynamic range, suitable for online measurement, not affected by jitter
Easy to operate, no complicated calibration required
Fast measurement, 100 times faster than traditional models
Ethernet communication, more stable and fast
Main application areas:
PCB board coating, semiconductor (silicon, monocrystalline silicon, polycrystalline silicon), semiconductor compound, micro-electromechanical (MEMS), oxide/nitride, photoresist, hard coating, polymer coating, polymer...
Range (measurable thickness range)
|Working Distance||7-70mm (depending on the spot)|
|Z-axis dynamic measurement range||5-10mm (no strict requirements for distance, fluctuations in this range can be measured)|
|Spot size||1-0.1mm (customizable size)|
|Measure speed||2000 times/sec|
Customer service contact information
Service hours:9:00 — 18:00
24 hours after sale