

Error analysis of three-dimensional profile measuring instrument
- Categories:News
- Time of issue:2022-06-14 14:10
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(Summary description)The three-dimensional profile measuring instrument is a geometric optical measuring instrument that has developed rapidly in recent years. Of course, there is a lot of information that everyone needs to know when using it.
Error analysis of three-dimensional profile measuring instrument
- Categories:News
- Time of issue:2022-06-14 14:10
- Views:
Three-dimensional profile measuring instrument is a geometric optical measuring instrument that has developed rapidly in recent years. Of course, there is a lot of information that everyone needs to know when using it. The following is an introduction to the error analysis of the three-dimensional profile measuring instrument? I hope it can bring you good help.
The three-dimensional profile measuring instrument is a kind of instrument based on the principle of optical projection, combined with modern photoelectric technology and computer processing technology, aiming at the edge contour of the sample. In this case, everyone needs to know it. A three-dimensional optical coordinate measuring machine that measures length and height dimensions. Therefore, it is necessary to know that the instrument can effectively detect the contour, surface shape, size, angle and position of complex-shaped workpieces, and is also characterized by microscopic detection and quality control of precision parts. It is suitable for product development, quality batch testing and other fields. Features are also reflected in other places. For example, it can be used with a color or monochrome camera for 2D measurement, so that the system also has the function of tool microscope measurement; and when working, it can also be equipped with a motorized nose wheel, which can simultaneously mount a variety of objective lenses and program-controlled switching. And there are some errors when using it. It has the error of the grating counter. There are also some common errors caused by the perpendicularity of the two measurement axes of the worktable; of course, in addition to this problem, there are some errors caused by the optical axis of the microscope being not perpendicular to the worktable.
These are the places that everyone must pay attention to when using the 3D profiler. Of course, these problems are actually formed and fixed during the manufacturing process of the instrument, and generally cannot be changed; at this time, it is recommended that you must control the temperature and isothermal process of the measurement chamber to reduce the error caused by temperature effects. Of course, there is one more item that is often overlooked. Then it is in the actual measurement, when the lighting conditions of the light source change, so in addition to what I said for everyone, it is mainly because the image of the automatic image measuring instrument is received, which will naturally directly affect the lighting effect of the workpiece to be measured. and image quality. Although it is said that it has an automatic gain adjustment function during use, you will also find that when the brightness is too large, the adjustment function will be lost, and of course, sometimes the image of the tested workpiece will be reduced. Conversely, when the brightness is too low, the workpiece image becomes large.
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